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1

Lift-off with solvent for negative resist using low energy electron beam exposure

Dey, Ripon Kumar, Cui, Bo

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2014

Language:

english

File:

PDF, 1.40 MB

english, 2014

2

The dependence of Schottky junction (I–V) characteristics on the metal probe size in nano metal–semiconductor contacts

Rezeq, Moh’d, Ali, Ahmed, Patole, Shashikant P., Eledlebi, Khouloud, Dey, Ripon Kumar, Cui, Bo

Journal:

Year:

2018

Language:

english

File:

PDF, 2.09 MB

english, 2018

3

Effect of molecular weight distribution on e-beam exposure properties of polystyrene

Dey, Ripon Kumar, Cui, Bo

Journal:

Year:

2013

Language:

english

File:

PDF, 448 KB

english, 2013

4

[IEEE 2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO) - Toronto, ON, Canada (2014.8.18-2014.8.21)] 14th IEEE International Conference on Nanotechnology - Characterization of nano Schottky junctions for a new structure of nano-electronic devices

Rezeq, Moh'd, Eledlebi, Khouloud, Ismail, Mohamed, Cui, Bo, Dey, Ripon Kumar

Year:

2014

Language:

english

File:

PDF, 398 KB

english, 2014

5

Stitching error reduction in electron beam lithography with in-situ feedback using self-developing resist

Dey, Ripon Kumar, Cui, Bo

Journal:

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures

Year:

2013

Language:

english

File:

PDF, 916 KB

english, 2013

6

Electron Beam Lithography on Irregular Surface Using Grafted PMMA Monolayer as Resist

Dey, Ripon Kumar, Aydinoglu, Ferhat, Cui, Bo

Journal:

Advanced Materials Interfaces

Year:

2016

Language:

english

File:

PDF, 807 KB

english, 2016

7

Theoretical and experimental investigations of nano-Schottky contacts

Rezeq, Moh'd, Eledlebi, Khouloud, Ismail, Mohammed, Dey, Ripon Kumar, Cui, Bo

Journal:

Journal of Applied Physics

Year:

2016

Language:

english

File:

PDF, 1.82 MB

english, 2016

8

Mixture of ZEP and PMMA with varying ratios for tunable sensitivity as a lift-off resist with controllable undercut

Zheng, Shuo, Dey, Ripon Kumar, Aydinoglu, Ferhat, Cui, Bo

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2016

Language:

english

File:

PDF, 951 KB

english, 2016

9

Grafted polystyrene monolayer brush as both negative and positive tone electron beam resist

Aydinoglu, Ferhat, Yamada, Hirotaka, Dey, Ripon Kumar, Cui, Bo

Journal:

Year:

2017

Language:

english

File:

PDF, 737 KB

english, 2017

10

Enhanced adhesion of electron beam resist by grafted monolayer poly(methylmethacrylate- co -methacrylic acid) brush

Viscomi, Francesco Narda, Dey, Ripon Kumar, Caputo, Roberto, Cui, Bo

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2015

Language:

english

File:

PDF, 1.36 MB

english, 2015

11

Chromium oxide as a hard mask material better than metallic chromium

Aydinoglu, Ferhat, Saffih, Faycal, Dey, Ripon Kumar, Cui, Bo

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 646 KB

english, 2017

12

Batch fabrication of AFM probes with direct positioning capability

Zheng, Shuo, Zhu, Chenxu, Dey, Ripon Kumar, Cui, Bo

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 1.05 MB

english, 2017

13

Oxidation sharpening of silicon tips in the atmospheric environment

Dey, Ripon Kumar, Shen, Jiashi, Cui, Bo

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2017

Language:

english

File:

PDF, 1.27 MB

english, 2017

14

Moth-eye antireflection nanostructure on glass for CubeSats

Liu, Yaoze, Soltani, Mohammad, Dey, Ripon Kumar, Cui, Bo, Lee, Regina, Podmore, Hugh

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2018

Language:

english

File:

PDF, 2.40 MB

english, 2018

15

Effects of mask material conductivity on lateral undercut etching in silicon nano-pillar fabrication

Dey, Ripon Kumar, Ekinci, Huseyin, Cui, Bo

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2020

File:

PDF, 1.98 MB

2020